Access a complete characterization suite capable of probing a range of orthogonal material properties with a single tool.
Measurement capabilities include:
-
Transmission
-
Spectrally-resolved Photoluminescence
-
Time-resolved Photoluminescence
-
Data acquisition rates on the order of 100's of milliseconds enable near real-time characterization. Quickly probe large format samples up to 210 x 210 mm (G12 wafer size) or study a batch of up to 36 1"x1" samples in seconds.
Quickly configure custom measurement routines and automate the data collection process. Just load your samples, press start, and let Prism do the rest. All data is then seamlessly streamed to onboard data management software or can be integrated into your organization's existing database.
The optical measurements included in the Prism benchtop measurement tool are inherently non-contact and non-destructive. Probe material quality or functional layers of interest at any point during a material's fabrication process.
* Laser wavelength can be selected from 405, 450, 520, 640, 785, and 820 nm
** Values provided are based on demonstrated capabilities
Transmission
Spectrally-Resolved PL
Time-Resolved PL
Light Source Wavelength (nm)
Detection Wavelength (nm)
Time Resolution (ns)
Measurement Speed (ms)
Spot Size (μm)
Power (mW)
500-950
405*
450*
350-1000
350-1000
450-1000
5
--
--
30
100
100
10-1000
10-1000
100
0-300
0-120
0-30
Hyperspectral Mapping
Scan Area
210 x 210 mm
210 x 210 mm
210 x 210 mm
Resolution** (µm)
100
5
5
Weight / Size
40 kg / 50 cm (W) x 70 cm (D) x 41 cm (H)
Power Requirements
100-240 VAC, 50/60 Hz
TECHNICAL SPECIFICATIONS
PRODUCT
Introducing Prism
Prism is a high-throughput, multi-modal characterization tool offering multidimensional data sets previously inaccessible with existing commercial tools. Unlock a holistic view of your material's performance with less time and effort thanks to high-speed data acquisition and fully automated operation.